refractive index of al2o3
Yes, David J Mandia et al 2015 Nanotechnology 26 434002, https://doi.org/10.1088/0957-4484/26/43/434002. Since the related parameters of all samples are extracted from and fits, we give both the experimental and calculated data, respectively, as shown in Figure 5. Data for the germanosilicate glass found in Ref. At core center, the fiber under study has an alumina content of just over 40 mole percent. The values can be improved by the thickness variation of films . It could be ascribed to the different testing material. A corollary finding is found in Ref. Therefore, a precise control of surface morphology during film growth process is very crucial to device performance. The compositions were evaluated by Scanning Electron Microscopy-Energy Dispersive Spectrometer (SEM-EDS, Zeiss 1450VP Scanning Electron Microscope). SE measurement shows that the fundamental structural parameter, film thickness, increases regularly with the increase of ALD cycles, corresponding to a growth rate of ~0.1 nm/cycle. The dielectric function of the films is determined by five parameters . As in Ref. The ellipsometer fitting iterative are evaluated by an objective optimization function [11, 12]. These values then are utilized to gain insight into n2 of amorphous Al2O3, which presumably differs from that of its crystalline analog, sapphire.19 The nonlinear refractive index is found to increase with alumina content when added to silica, an important finding for high‐energy fiber lasers. The reacting temperature remained constant at 200°C. 51605449, 51422510, 51675493, and 61471326), Shanxi Province Applied Fundamental Research Program (201601D021064), the National High Technology Research and Development (863) Program of China (Grant no. Structural and electronic parameters extracted from SE analysis of the five different samples. The optical band gap of Al2O3 has been extracted from the SE analysis. As explained below, the fitted curve (dashed orange line) requires that n2 be increased by 12% in order to match the values determined from the data points. The analysis was limited to the range from 0 to 10 μm in the fiber radial direction in order to avoid significant uncertainty introduced by the positions of the RIPs where the slope is most steep. Similarly, another optical measurement method, UV-VIS transmittance spectrum, is used to verify the obtained SE results. In this case, the refractive index of Al 2 O 3 was found These effects are discussed with support from TFBG simulations and models, by quantifying the penetration of the evanescently coupled light out of the fiber through the various coating layers. The surface chemistry reaction for ALD-Al2O3 can be expressed asThe overall reaction is refers to the functional groups adsorbed on the deposition surface, showing that self-stop gas-solid reaction is the basis of ALD. The bulk layer plays a key role in the values of Al2O3 samples, and the surface roughness is subordinate. It is likely because of the different testing principle in the two methods. The purity, roughness, and morphology of gold thin films deposited by CVD onto the dielectric-TFBG surface are also provided. The intensity of XRD is sensitive to the atomic arrangement of material, so it is capable of analyzing crystal structure. Volume 26, These results are shown graphically in Figure 3 and are tabulated in Table 2 where the best‐fit coefficients are provided. Ellipsometry measures the two values and , which express the amplitude ratio and phase difference between polarization and polarization, shown in (1). Please check your email for instructions on resetting your password. Since according to Ref. Figure 2 provides a radial RIP, from core center to the silica cladding (zero index difference), along with an expanded view of the region utilized in this study. Working off-campus? Result shows that value of samples is dependent on film thickness. Two‐dimensional fiber refractive index profiles (RIPs) were measured transversely through the side of the fiber using a spatially resolved Fourier transform interferometer23 at selected wavelengths (488 nm, 590 nm, 660 nm, 730 nm, 850 nm, and 958 nm). Figure 7 gives the UV-VIS transmittance spectra of samples in the wavelength range from 300 to 800 nm. Thus, the growth rate is constant in the ALD process, which is insensitive to changes in process parameters, and the deposited films have excellent thickness uniformity and three-dimensional conformity. The thicker samples may exhibit stress and strain, and thinner films may have amorphous phase . No potential conflicts of interest were reported by the authors. However, the influences are inevitable resulting from the interfacial layer. An apparent mathematical relationship between the two sets of value cannot be found. 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